100W

source power

10kV

minimum source voltage

50kV

maximum source voltage

X-Ray Fluorescence

The Avaatech Core Scanner employs Energy Dispersive X-ray Fluorescence (ED-XRF) to non-destructively determine the qualitative elemental composition of sediment cores. Elemental spectra can be acquired from sodium, the lightest detectable element, up to uranium, the heaviest, using a dedicated helium-purged measurement chamber. To support high-quality spectral acquisition across this range, the scanner utilizes various primary beam filters to enhance signal-to-noise ratios for specific element ranges.

Na – U

Measurable Elements

Rhodium

X-Ray Source

Graphene / beryllium

Silicon Drift Detector

0.1-10mm

Downcore Area

1-12mm

Crosscore Area

0.1mm

Minimum Stepsize

Scan Specifications

The system accommodates a wide range of core and sample sizes, allowing for ultra-high precision scanning regardless of format. Measurement area, duration, and position are highly configurable, enabling both rapid, large-scale overviews and detailed localized scans as required by your research objectives.

Data Transparency

To support seamless integration into your research workflow, ED-XRF data is delivered in convenient file formats. Raw data is acquired as counts per channel and, using specialized software, can be further processed into counts per element. To aid interpretation, each data point is accompanied by the corresponding measurement conditions, providing insight into how acquisition settings may influence results. In line with our commitment to transparency, all data generated during scanning is made fully available to the user.

Counts / channel

raw data output

Counts / Element

processed data output

All Data

made available to the user

Together, these measurement systems provide a highly adaptable and precise elemental analysis platform, delivering comprehensive, well-documented data to support informed geological interpretation. Ongoing developments like Elemental Core Mapping and Fly Scanning aim to further enhance analytical depth and scanning efficiency.