100W
source power
10kV
minimum source voltage
50kV
maximum source voltage
X-Ray Fluorescence
The Avaatech Core Scanner employs Energy Dispersive X-ray Fluorescence (ED-XRF) to non-destructively determine the qualitative elemental composition of sediment cores. Elemental spectra can be acquired from sodium, the lightest detectable element, up to uranium, the heaviest, using a dedicated helium-purged measurement chamber. To support high-quality spectral acquisition across this range, the scanner utilizes various primary beam filters to enhance signal-to-noise ratios for specific element ranges.
Na – U
Measurable Elements
Rhodium
X-Ray Source
Graphene / beryllium
Silicon Drift Detector
0.1-10mm
Downcore Area
1-12mm
Crosscore Area
0.1mm
Minimum Stepsize
Scan Specifications
The system accommodates a wide range of core and sample sizes, allowing for ultra-high precision scanning regardless of format. Measurement area, duration, and position are highly configurable, enabling both rapid, large-scale overviews and detailed localized scans as required by your research objectives.
Data Transparency
To support seamless integration into your research workflow, ED-XRF data is delivered in convenient file formats. Raw data is acquired as counts per channel and, using specialized software, can be further processed into counts per element. To aid interpretation, each data point is accompanied by the corresponding measurement conditions, providing insight into how acquisition settings may influence results. In line with our commitment to transparency, all data generated during scanning is made fully available to the user.
Counts / channel
raw data output
Counts / Element
processed data output
All Data
made available to the user
Together, these measurement systems provide a highly adaptable and precise elemental analysis platform, delivering comprehensive, well-documented data to support informed geological interpretation. Ongoing developments like Elemental Core Mapping and Fly Scanning aim to further enhance analytical depth and scanning efficiency.
