Elemental Core Mapping
XRF Elemental Core Mapping is a new feature designed to measure elemental variations across and along core samples. By rapidly generating detailed elemental maps, researchers can quickly identify areas of interest, streamlining the analysis process for geological studies.
Customizable Scanning
The new feature enables users to scan core samples on a fully customizable grid. The grid allows precise control over step size and slit size in both down-core and cross-core directions. The system supports offsets of up to ±45 mm in the cross-core direction from the sample’s centerline, providing flexibility to study previously underexposed areas of the sample.
Collected data is recorded as counts per channel across the entire scanned grid and can be saved into a single file for analysis. The integrated software displays elemental intensity maps in RGB format, where each color channel corresponds to a specific element. Selecting any point on the map instantly reveals its processed spectra and associated data, facilitating faster exploration of the sample.
Elemental map comparison
A partial example of a line scan and an elemental map overlay is shown below (viewed best on desktop). To acquire the map, 31000 individual positions of 1x1mm have been measured. These huge amounts of data can be made visible in a matter of seconds with our newest software .
Red
SI Silicium intensity
GREEN
CA Calcium intensity
BLUE
FE Iron intensity
Designed for Efficiency
With elemental mapping, researchers can rapidly assess elemental distribution and gain insights into their samples. Whether identifying trace element concentrations or mapping broader trends, XRF Elemental Core Mapping provides a reliable and efficient solution for geological research.
Future Innovations
Our engineers are actively incorporating this feature into new core scanners, ensuring its availability in upcoming systems. Additionally, a new feature called Fly Scanning is under development to enhance scanning speed, catering to high-throughput applications without compromising data quality. These advancements are set to further streamline elemental mapping processes, providing researchers with faster and more powerful tools.
See Fly scanning >