 |
|
|
Contact
Home
History
Optical System
Specifications
|
© 2010, Avaatech - The Netherlands.
Latest page update: 21st June 2008
The first XRF core-scanner has been developed in 1987 to 1989 by a group of technicians and scientists at the Royal Netherlands Institute for Sea Research (NIOZ). For this the conventional X-ray fluorescence (XRF) method, working with dry, homogenized, and flat samples, has been applied to measure wet sediments from split sediment cores. With the experience of the original group, that is now working at Avaatech, and supported nowadays with the technical and scientific experience from the NIOZ, this instrument has been very successful (see the list of publications). Since the first scanner has been constructed many improvements and new developments have been carried out resulting in higher speed of measurements, lower detection limits of elements, increased number of detectable elements, and an increased resolution.
Initially the instrument was developed to find promising positions in sediment cores that could be sampled for detailed analysis (minerals, forams, pollen, etc.). In this way the XRF is used as a pilot tool/logging, and thus can be regarded as a cost-effective tool. Nowadays curves of chemical elements can directly be used as a signature of a certain sedimentary processes. For example, Ca records tracing biogenic carbonate can provide for preliminary stratigraphic information. To obtain quantitative information from such a data set of the XRF scanner a limited number of samples of such cores can be analyzed by conventional XRF, AAS, or ICP analysis for calibration and thus provide for quantitative chemical character of the Ca-curve.
Recently a high-resolution variable optical system and its straight forward XRF analysis the Avaatech scanner can be used to measure every type of sediment providing for optimum results in combination with a wide range of elements with low detection limits within reasonable time.
Initially the instrument was developed to find promising positions in sediment cores that could be sampled for detailed analysis (minerals, forams, pollen, etc.). In this way the XRF is used as a pilot tool/logging, and thus can be regarded as a cost-effective tool. Nowadays curves of chemical elements can directly be used as a signature of a certain sedimentary processes. For example, Ca records tracing biogenic carbonate can provide for preliminary stratigraphic information. To obtain quantitative information from such a data set of the XRF scanner a limited number of samples of such cores can be analyzed by conventional XRF, AAS, or ICP analysis for calibration and thus provide for quantitative chemical character of the Ca-curve.
Recently a high-resolution variable optical system and its straight forward XRF analysis the Avaatech scanner can be used to measure every type of sediment providing for optimum results in combination with a wide range of elements with low detection limits within reasonable time.